This 2001 hardcover provides a detailed analysis of microwave noise phenomena in semiconductor devices, covering theoretical models, measurement techniques, and noise reduction strategies. It is an advanced resource for electrical engineers, physicists, and researchers working in microwave electronics and device physics.
Additional Product Info :
ISBN 10 :
0471384321
ISBN 13 :
9780471384328
Publisher :
JOHN WILEY
Language :
English
Dimensions :
6.38 x 0.82 x 9.67
Item Weight :
0.56 kg